Characterisation and Control of Defects in Semiconductors

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Engineering - Electrical & Electronic Engineering
Characterisation and Control of Defects...

Characterisation and Control of Defects in Semiconductors

Name: Characterisation and Control of Defects in Semiconductors
ISBN: 9781785616556

Filip Tuomisto

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This book provides an up-to-date review of the experimental and theoretical methods used for studying defects in semiconductors, this book focuses on recent developments driven by the requirements of new materials, including nitrides, oxide semiconductors and 2-D semiconductors.

Categorie:

Engineering - Electrical & Electronic Engineering

Anno:

2019

Casa editrice:

Materials, Circuits and Device

Lingua:

english

Pagine:

601

ISBN 10:

1785616552